Characterization of Nd2−xCexCuO4±δ (x = 0 and 0.15)...

IEEE Transactions on Appiled Superconductivity 2017 / 6 Vol. 27; Iss. 4

Characterization of Nd2−xCexCuO4±δ (x = 0 and 0.15) Ultrathin Films Grown by DC Sputtering Technique

Guarino, A., Romano, P., Avitabile, F., Leo, A., Martucciello, N., Grimaldi, G., Ubaldini, A., D'Agostino, D., Bobba, F., Vecchione, A., Pace, S., Nigro, A.
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/tasc.2016.2634319
Date:
June, 2017
File:
PDF, 404 KB
english, 2017
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