Resistance-Switching Characteristics of Si-rich Oxide Evaluated by Using Ni Nanodots as Electrodes in Conductive AFM Measurements
OHTA, Akio, LIU, Chong, ARAI, Takashi, TAKEUCHI, Daichi, ZHANG, Hai, MAKIHARA, Katsunori, MIYAZAKI, SeiichiVolume:
E98.C
Year:
2015
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e98.c.406
File:
PDF, 1.86 MB
english, 2015