![](/img/cover-not-exists.png)
High temperature storage test and its effect on the thermal stability and electrical characteristics of AlGaN/GaN high electron mobility transistors
Lee, Jong-Min, Min, Byoung-Gue, Ju, Cheol-Won, Ahn, Ho-Kyun, Lim, Jong-WonVolume:
17
Language:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2016.11.014
Date:
February, 2017
File:
PDF, 1.02 MB
english, 2017