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Tip-Enhanced Raman Voltammetry: Coverage Dependence and Quantitative Modeling
Mattei, Michael, Kang, Gyeongwon, Goubert, Guillaume, Chulhai, Dhabih V., Schatz, George C., Jensen, Lasse, Van Duyne, Richard P.Volume:
17
Language:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.6b04868
Date:
January, 2017
File:
PDF, 1.57 MB
english, 2017