The Investigation on Single Event Function Failure for...

Chinese Journal of Electronics 2016 / 11 Vol. 25; Iss. 6

The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures

Li, Pengwei, Wang, Wenyan, Luo, Lei, Yu, Qingkui, Tang, Min, Du, Feipeng, Liu, Jie
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Volume:
25
Language:
english
Journal:
Chinese Journal of Electronics
DOI:
10.1049/cje.2016.08.016
Date:
November, 2016
File:
PDF, 231 KB
english, 2016
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