Interface engineering for improving reliability of...

Applied Physics Letters 2015 / 08 Vol. 107; Iss. 7

Interface engineering for improving reliability of resistance switching in Cu/HfO 2 /TiO 2 /Pt structure

Wei Zhou, Li, Long Shao, Xing, Yuan Li, Xiang, Jiang, Hao, Chen, Ran, Jean Yoon, Kyung, Jin Kim, Hae, Zhang, Kailiang, Zhao, Jinshi, Seong Hwang, Cheol
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Volume:
107
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4928710
Date:
August, 2015
File:
PDF, 1.31 MB
english, 2015
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