Anomalous degradation of low-field mobility in...

Journal of Applied Physics 2015 / 12 Vol. 118; Iss. 23

Anomalous degradation of low-field mobility in short-channel metal-oxide-semiconductor field-effect transistors

Natori, Kenji, Iwai, Hiroshi, Kakushima, Kuniyuki
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Volume:
118
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4937548
Date:
December, 2015
File:
PDF, 544 KB
english, 2015
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