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[IEEE 2016 IEEE 62nd IEEE Holm Conference on Electrical Contacts (Holm) - Clearwater Beach, FL, USA (2016.10.9-2016.10.12)] 2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) - Microstructure of fretting debris on tin-plated terminals
Mashimo, Keiji, Yamazaki, Satoshi, Shimoyamada, Atsushi, Nishikubo, Hideo, Hori, Yujin, Sasaki, HirokazuYear:
2016
DOI:
10.1109/HOLM.2016.7780022
File:
PDF, 1.60 MB
2016