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[IEEE 2016 IEEE International Conference on Imaging Systems and Techniques (IST) - Chania, Greece (2016.10.4-2016.10.6)] 2016 IEEE International Conference on Imaging Systems and Techniques (IST) - A new symmetric semi-parallel Electrical Impedance Tomography (EIT) system - II: The performance
Miao, Liwen, Ma, Yixin, Chen, Xinyi, Xiong, Xiaofan, Cai, Ping, Qin, Peng, Ji, Xiaojun, Han, TaoYear:
2016
Language:
english
DOI:
10.1109/ist.2016.7738238
File:
PDF, 1.21 MB
english, 2016