Failure Detection Method for GaN-Based Dosimetric Systems

Key Engineering Materials 2015 / 5 Vol. 644

Failure Detection Method for GaN-Based Dosimetric Systems

Guiral, Pierrick, Galvan, Jean Marc, Pittet, Patrick, Wang, Ruo Xi, Lu, Guo Neng, Jalade, Patrice, Dauvergne, Denis
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Volume:
644
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.644.78
Date:
May, 2015
File:
PDF, 1.01 MB
english, 2015
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