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TEM Analysis of InGaAs/GaAs Quantum Well-Quantum Dot Structures for Optoelectronics Applications
Kanzyuba, V., Rouvimov, S., Mintairov, S.A., Kalyuzhnyy, N.A., Maximov, M.V., Nadtochiy, A.M., Zhukov, A.E.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616007121
Date:
July, 2016
File:
PDF, 1.66 MB
english, 2016