Radiation hardness studies of neutron irradiated CMOS...

Journal of Instrumentation 2016 / 02 Vol. 11; Iss. 2

Radiation hardness studies of neutron irradiated CMOS sensors fabricated in the ams H18 high voltage process

García, M. Fernández, Gallrapp, C., Moll, M., Muenstermann, D.
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Volume:
11
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/11/02/P02016
Date:
February, 2016
File:
PDF, 1.01 MB
english, 2016
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