AMR Steganalysis Based on Second-Order Difference of Pitch Delay
Ren, Yanzhen, Yang, Jing, Wang, Jinwei, Wang, LinaVolume:
12
Language:
english
Journal:
IEEE Transactions on Information Forensics and Security
DOI:
10.1109/TIFS.2016.2636087
Date:
June, 2017
File:
PDF, 1.57 MB
english, 2017