Statistics on Applied Voltages in Schottky Barrier Diodes at Same Forward Current in a Fabrication Process
Zhang, Kui, Zhao, Hong-Dong, Ahmed, Hafiz Shehzad, Sun, MeiVolume:
30
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2016.2636418
Date:
February, 2017
File:
PDF, 128 KB
english, 2017