Experimental investigation of multi-path and metal-stacking...

Electronics Letters 2016 / 11 Vol. 52; Iss. 24

Experimental investigation of multi-path and metal-stacking structure for 8-shape on-chip inductors on standard CMOS

Zou, Wanghui, Chen, Diping, Peng, Wei, Zeng, Yun
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Volume:
52
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2016.3442
Date:
November, 2016
File:
PDF, 355 KB
english, 2016
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