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Highly conductive grain boundaries in copper oxide thin films
Deuermeier, Jonas, Wardenga, Hans F., Morasch, Jan, Siol, Sebastian, Nandy, Suman, Calmeiro, Tomás, Martins, Rodrigo, Klein, Andreas, Fortunato, ElviraVolume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4954002
Date:
June, 2016
File:
PDF, 1.12 MB
english, 2016