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Time-resolved X-ray diffraction reveals the origins of high dielectric and electromechanical responses in ferroelectrics
Gorfman, Semën, Choe, Hyeokmin, Ziolkowski, Michael, Iamsasri, Thanakorn, Jones, Jacob, Shvartsman, Vladimir, Dec, Jan, Pietsch, UllrichVolume:
71
Journal:
Acta Crystallographica Section A Foundations and Advances
DOI:
10.1107/S2053273315098757
Date:
August, 2015
File:
PDF, 111 KB
2015