Study of indium phosphide wafers treated by long time...

Study of indium phosphide wafers treated by long time annealing at high temperatures

Zdansky, K., Pekarek, L., Hlidek, P.
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Volume:
27
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2004118
Date:
July, 2004
File:
PDF, 295 KB
english, 2004
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