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Optical Measurement of the Dynamic Contact Process of a MEMS Inertial Switch Under High Shock Loads
Cao, Yun, Xi, Zhanwen, Yu, Pingxin, Wang, Jiong, Nie, WeirongVolume:
64
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/tie.2016.2608320
Date:
January, 2017
File:
PDF, 1.92 MB
english, 2017