In situ break-junction sample holder for transmission electron microscopy
Eswara Moorthy, Santhana K., Le Goff, Gerald, Viret, Michel, Kociak, MathieuVolume:
64
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap/2013130365
Date:
December, 2013
File:
PDF, 409 KB
english, 2013