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Auger generation as an intrinsic limit to tunneling field-effect transistor performance
Teherani, James T., Agarwal, Sapan, Chern, Winston, Solomon, Paul M., Yablonovitch, Eli, Antoniadis, Dimitri A.Volume:
120
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4960571
Date:
August, 2016
File:
PDF, 1.36 MB
english, 2016