AIP Conference Proceedings [Author(s) ICXOM23:...

AIP Conference Proceedings [Author(s) ICXOM23: International Conference on X-ray Optics and Microanalysis - Upton, NY, USA (14–18 September 2015)] - Nm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challenges

Nazaretski, E., Yan, H., Lauer, K., Huang, X., Xu, W., Kalbfleisch, S., Yan, Hui, Li, Li, Bouet, N., Zhou, J., Shu, D., Conley, R., Chu, Y. S.

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Volume:

1764

Year:

2016

Language:

english

DOI:

10.1063/1.4961143

File:

PDF, 2.73 MB

english, 2016

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