[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Amherst, NY, USA (1985.10.20-1985.10.24)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Life testing and reliability estimation of epoxy cast resin materials
Udayakumar, K., Sanavullah, M. Y., Panneerselvam, M. A., Dharmalingam, K.Year:
1985
Language:
english
DOI:
10.1109/ceidp.1985.7728291
File:
PDF, 551 KB
english, 1985