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[IEEE Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Amherst, NY, USA (1985.10.20-1985.10.24)] Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985 - Life testing and reliability estimation of epoxy cast resin materials

Udayakumar, K., Sanavullah, M. Y., Panneerselvam, M. A., Dharmalingam, K.
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Year:
1985
Language:
english
DOI:
10.1109/ceidp.1985.7728291
File:
PDF, 551 KB
english, 1985
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