[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - NBTI aging analysis and aging-tolerant design of p-type domino AND gatesp
Zhang Lin,, Yi Maoxiang,, Yuan Ye,, Gan Yingxian,, Xu Hui,, Liang Huaguo,Year:
2015
Language:
english
DOI:
10.1109/icemi.2015.7494216
File:
PDF, 7.01 MB
english, 2015