[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu, Brazil (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage
Forero, Freddy, Gomez, Andres, Champac, VictorYear:
2016
Language:
english
DOI:
10.1109/latw.2016.7483344
File:
PDF, 2.49 MB
english, 2016