On Microarchitectural Mechanisms for Cache Wearout...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2017 / 3 Vol. 25; Iss. 3

On Microarchitectural Mechanisms for Cache Wearout Reduction

Valero, Alejandro, Miralaei, Negar, Petit, Salvador, Sahuquillo, Julio, Jones, Timothy M.
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Volume:
25
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2016.2625809
Date:
March, 2017
File:
PDF, 3.33 MB
english, 2017
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