Analysis on the Filament Structure Evolution in Reset...

Nanoscale Research Letters 2016 / 12 Vol. 11; Iss. 1

Analysis on the Filament Structure Evolution in Reset Transition of Cu/HfO2/Pt RRAM Device

Zhang, Meiyun, Long, Shibing, Li, Yang, Liu, Qi, Lv, Hangbing, Miranda, Enrique, Suñé, Jordi, Liu, Ming
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Volume:
11
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/s11671-016-1484-8
Date:
December, 2016
File:
PDF, 1.12 MB
english, 2016
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