Aufbau zur flächigen reflektrometrischen...

Aufbau zur flächigen reflektrometrischen Schichtdickenbestimmung von lateral bewegten Schichtsystemen

Tremmel, Anton J., Rauscher, Markus S., Murr, Patrik J., Schardt, Michael, Koch, Alexander  W.
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Volume:
83
Language:
german
Journal:
tm - Technisches Messen
DOI:
10.1515/teme-2015-0105
Date:
January, 2016
File:
PDF, 1006 KB
german, 2016
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