A Supercritical Lens Optical Label-Free Microscopy:...

Advanced Materials 2017 / 02 Vol. 29; Iss. 8

A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance

Qin, Fei, Huang, Kun, Wu, Jianfeng, Teng, Jinghua, Qiu, Cheng-Wei, Hong, Minghui
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Volume:
29
Language:
english
Journal:
Advanced Materials
DOI:
10.1002/adma.201602721
Date:
February, 2017
File:
PDF, 1.72 MB
english, 2017
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