Temperature dependent study of basal plane stacking faults...

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Materials Science in Semiconductor Processing 2016 / 12

Temperature dependent study of basal plane stacking faults in Ag:ZnO nanorods by Raman and photoluminescence spectroscopy

Khranovskyy, Volodymyr, Sendova, Mariana, Hosterman, Brian, McGinnis, Navin, Shtepliuk, Ivan, Yakimova, Rositsa
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Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2016.12.009
Date:
December, 2016
File:
PDF, 1.11 MB
english, 2016
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