Noise and transport characterization of single molecular break junctions with individual molecule
Sydoruk, V. A., Xiang, D., Vitusevich, S. A., Petrychuk, M. V., Vladyka, A., Zhang, Y., Offenhäusser, A., Kochelap, V. A., Belyaev, A. E., Mayer, D.Volume:
112
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4736558
Date:
July, 2012
File:
PDF, 744 KB
english, 2012