A comprehensive investigation of silicon film thickness (...

Advances in Natural Sciences: Nanoscience and Nanotechnology 2016 / 08 Vol. 7; Iss. 3

A comprehensive investigation of silicon film thickness ( T SI ) of nanoscale DG TFET for low power applications

Ranjan, Rajeev, Mallikarjunarao,, Pradhan, K P, Sahu, P K
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Volume:
7
Language:
english
Journal:
Advances in Natural Sciences: Nanoscience and Nanotechnology
DOI:
10.1088/2043-6262/7/3/035009
Date:
August, 2016
File:
PDF, 4.09 MB
english, 2016
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