[IEEE 2016 5th International Conference on Reliability,...

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[IEEE 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2016.9.7-2016.9.9)] 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Educational data mining and big data framework for e-learning environment

Udupi, Prakash Kumar, Sharma, Nisha, Jha, S K
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Year:
2016
Language:
english
DOI:
10.1109/ICRITO.2016.7784961
File:
PDF, 359 KB
english, 2016
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