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Contributed Review: Experimental characterization of inverse piezoelectric strain in GaN HEMTs via micro-Raman spectroscopy
Bagnall, Kevin R., Wang, Evelyn N.Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4954203
Date:
June, 2016
File:
PDF, 1.41 MB
english, 2016