MTF, NPS and DQE characterization of an in-house developed...

MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography

Desjardins, K, Bordessoule, M, Petrache, C, Menneglier, C, Dallé, D, Mercere, P, Medjoubi, K
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Volume:
9
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/9/06/C06001
Date:
June, 2014
File:
PDF, 565 KB
english, 2014
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