[IEEE 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Las Vegas, NV, USA (2016.6.26-2016.7.1)] 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Learning Cross-Spectral Similarity Measures with Deep Convolutional Neural Networks
Aguilera, Cristhian A., Aguilera, Francisco J., Sappa, Angel D., Aguilera, Cristhian, Toledo, RicardoYear:
2016
Language:
english
DOI:
10.1109/CVPRW.2016.40
File:
PDF, 541 KB
english, 2016