Robust Visualization and Discrimination of Nanoparticles by Interferometric Imaging
Trueb, Jacob T., Avci, Oguzhan, Sevenler, Derin, Connor, John H., Unlu, M. SelimVolume:
23
Language:
english
Journal:
IEEE Journal of Selected Topics in Quantum Electronics
DOI:
10.1109/JSTQE.2016.2639824
Date:
March, 2017
File:
PDF, 1.24 MB
english, 2017