IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences
2010 Vol. E93-A; Iss. 12
Reduction of Area per Good Die for SoC Memory Built-In Self-Test
ARAI, Masayuki, ENDO, Tatsuro, IWASAKI, Kazuhiko, NAKAO, Michinobu, SUZUKI, IwaoVolume:
E93-A
Year:
2010
Language:
english
Journal:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
DOI:
10.1587/transfun.e93.a.2463
File:
PDF, 1.58 MB
english, 2010