Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
KIM, Yongjoon, YANG, Myung-Hoon, PARK, Jaeseok, PARK, Eunsei, KANG, SunghoVolume:
E92-D
Year:
2009
Language:
english
Journal:
IEICE Transactions on Information and Systems
DOI:
10.1587/transinf.e92.d.1462
File:
PDF, 887 KB
english, 2009