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Effect of stress voltage on the dynamic buffer response of GaN-on-silicon transistors
Yacoub, H., Fahle, D., Eickelkamp, M., Wille, A., Mauder, C., Heuken, M., Kalisch, H., Vescan, A.Volume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4944885
Date:
April, 2016
File:
PDF, 2.09 MB
english, 2016