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[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Measurement and modeling techniques for InP-based HBT devices to 220GHz
Lu, Haiyan, Cheng, Wei, Zhou, Zhijiang, Li, Oupeng, Niu, Bin, Kong, Yuechan, Chen, TangshengYear:
2016
DOI:
10.1109/EDSSC.2016.7785227
File:
PDF, 501 KB
2016