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[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - High reliability multi-channel output voltage switch for multitime programmable memory in standard CMOS process
Wang, Jiasong, Li, Jiancheng, Wang, Hongyi, Li, Cong, Luo, ZhipengYear:
2016
DOI:
10.1109/EDSSC.2016.7785281
File:
PDF, 772 KB
2016