[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Energy versus Data Integrity Trade-Offs in Embedded High-Density Logic Compatible Dynamic Memories
Teman, Adam, Karakonstantis, Georgios, Giterman, Robert, Meinerzhagen, Pascal, Burg, AndreasYear:
2015
Language:
english
DOI:
10.7873/DATE.2015.0783
File:
PDF, 300 KB
english, 2015