Synchrotron X-ray diffraction imaging studies of...

Journal of Crystal Growth 2016 / 12

Synchrotron X-ray diffraction imaging studies of dislocations in Kyropoulos grown Ti doped sapphire crystal

Sen, Gourav, Tran Caliste, Thu Nhi, Stelian, Carmen, Baruchel, José, Barthalay, Nicolas, Duffar, Thierry
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Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2016.12.079
Date:
December, 2016
File:
PDF, 1.43 MB
english, 2016
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