Rietveld refinement of X-ray powder diffraction data of...

Powder Diffraction 2016 / 03 Vol. 31; Iss. 1

Rietveld refinement of X-ray powder diffraction data of Sm0.55Sr0.45MnO3 polycrystalline material

Murugesan, G., Nithya, R., Kalainathan, S.
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Volume:
31
Language:
english
Journal:
Powder Diffraction
DOI:
10.1017/s0885715615000792
Date:
March, 2016
File:
PDF, 124 KB
english, 2016
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