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Microscopy and Microanalysis 2016 / 10

Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

Diercks, David R., Gorman, Brian P., Mulders, Johannes J. L.
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Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616011740
Date:
October, 2016
File:
PDF, 443 KB
english, 2016
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