Development of correction methods for variable pinhole...

Development of correction methods for variable pinhole single-photon emission computed tomography

Bae, S., Bae, J., Lee, H., Lee, K.
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Volume:
11
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/11/02/C02060
Date:
February, 2016
File:
PDF, 1.77 MB
english, 2016
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