Electronic transport through Al/InN nanowire/Al junctions

Applied Physics Letters 2016 / 02 Vol. 108; Iss. 6

Electronic transport through Al/InN nanowire/Al junctions

Lu, T. M., Wang, G. T., Pan, W., Zhao, S., Mi, Z.
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Volume:
108
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4941733
Date:
February, 2016
File:
PDF, 1.12 MB
english, 2016
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