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Quantitative determination of optical and recombination losses in thin-film photovoltaic devices based on external quantum efficiency analysis
Nakane, Akihiro, Tampo, Hitoshi, Tamakoshi, Masato, Fujimoto, Shohei, Kim, Kang Min, Kim, Shinho, Shibata, Hajime, Niki, Shigeru, Fujiwara, HiroyukiVolume:
120
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4960698
Date:
August, 2016
File:
PDF, 6.13 MB
english, 2016