Investigation on Failure Mechanisms of GaN HEMT Caused by...

IEEE Transactions on Electromagnetic Compatibility 2017 / 6 Vol. 59; Iss. 3

Investigation on Failure Mechanisms of GaN HEMT Caused by High-Power Microwave (HPM) Pulses

Zhou, Liang, San, Zheng Wei, Hua, Yu-Jie, Lin, Liang, Zhang, Shuo, Zhao, Zheng Guo, Zhou, Hai Jing, Yin, Wen-Yan
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/temc.2016.2628046
Date:
June, 2017
File:
PDF, 1.09 MB
english, 2017
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